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Source: The Open Library
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1Materials reliability in microelectronics IV
By William F. Filter and Kenneth P. Rodbell
“Materials reliability in microelectronics IV” Metadata:
- Title: ➤ Materials reliability in microelectronics IV
- Authors: William F. FilterKenneth P. Rodbell
- Language: English
- Number of Pages: Median: 630
- Publisher: Materials Research Society
- Publish Date: 1994 - 1999
- Publish Location: Pittsburgh, Pa
“Materials reliability in microelectronics IV” Subjects and Themes:
- Subjects: ➤ Reliability - Congresses - Materials - Testing - Microelectronics - Electrodiffusion - Microélectronique - Congrès - Fiabilité - Électromigration - Kongress - Mikroelektronik - Mikrostruktur - Zuverlässigkeit
Edition Identifiers:
- The Open Library ID: OL19631716M - OL12091887M
- Online Computer Library Center (OCLC) ID: 31447409
- All ISBNs: 9781558992382 - 1558992383
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
Downloads Are Not Available:
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- Borrowing from Archive.org: Borrowing link
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