VLSI fault modeling and testing techniques - Info and Reading Options
By George W. Zobrist
"VLSI fault modeling and testing techniques" was published by Ablex Pub. Corp. in 1993 - Norwood, NJ, it has 199 pages and the language of the book is English.
“VLSI fault modeling and testing techniques” Metadata:
- Title: ➤ VLSI fault modeling and testing techniques
- Author: George W. Zobrist
- Language: English
- Number of Pages: 199
- Publisher: Ablex Pub. Corp.
- Publish Date: 1993
- Publish Location: Norwood, NJ
“VLSI fault modeling and testing techniques” Subjects and Themes:
- Subjects: ➤ Very large scale integration - Testing - Integrated circuits - Data processing - Electric fault location - Integrated circuits, very large scale integration - Fault-tolerant computing - Very large scale integration Testing Data processing
Edition Specifications:
- Pagination: vii, 199 p. :
Edition Identifiers:
- The Open Library ID: OL1720234M - OL18828775W
- Online Computer Library Center (OCLC) ID: 26361402
- Library of Congress Control Number (LCCN): 92023433
- ISBN-13: 9780893917814
- ISBN-10: 0893917818
- All ISBNs: 0893917818 - 9780893917814
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