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Vlsi Fault Modeling And Testing Techniques
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Source: The Open Library
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1VLSI fault modeling and testing techniques
By George W. Zobrist
“VLSI fault modeling and testing techniques” Metadata:
- Title: ➤ VLSI fault modeling and testing techniques
- Author: George W. Zobrist
- Language: English
- Number of Pages: Median: 199
- Publisher: Ablex Pub. Corp.
- Publish Date: 1993
- Publish Location: Norwood, NJ
“VLSI fault modeling and testing techniques” Subjects and Themes:
- Subjects: ➤ Very large scale integration - Testing - Integrated circuits - Data processing - Electric fault location - Integrated circuits, very large scale integration - Fault-tolerant computing
Edition Identifiers:
- The Open Library ID: OL1720234M
- Online Computer Library Center (OCLC) ID: 26361402
- Library of Congress Control Number (LCCN): 92023433
- All ISBNs: 0893917818 - 9780893917814
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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2VLSI Fault Modeling and Testing Techniques
By George W. Zobrist
“VLSI Fault Modeling and Testing Techniques” Metadata:
- Title: ➤ VLSI Fault Modeling and Testing Techniques
- Author: George W. Zobrist
- Language: English
- Number of Pages: Median: 208
- Publisher: Ablex Publishing
- Publish Date: 1993
Edition Identifiers:
- The Open Library ID: OL8236949M
- All ISBNs: 9780893917814 - 0893917818
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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Online Marketplaces
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- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
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