Test structure implementation document - Info and Reading Options
DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)
By C. E Schuster
"Test structure implementation document" was published by U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology in 1995 - Gaithersburg, MD, it has 88 pages and the language of the book is English.
“Test structure implementation document” Metadata:
- Title: ➤ Test structure implementation document
- Author: C. E Schuster
- Language: English
- Number of Pages: 88
- Publisher: ➤ U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
- Publish Date: 1995
- Publish Location: Gaithersburg, MD
“Test structure implementation document” Subjects and Themes:
- Subjects: Design - Data processing - Computer-aided design - Gallium arsenide semiconductors - Microwave integrated circuits
Edition Specifications:
- Format: Microform
- Pagination: iv, 88 p.
Edition Identifiers:
- The Open Library ID: OL13619024M - OL10396524W
- Online Computer Library Center (OCLC) ID: 34871880
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