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Electromigration Modeling At Circuit Layout Level by Cher Ming Tan
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1Electromigration Modeling at Circuit Layout Level
By Cher Ming Tan
“Electromigration Modeling at Circuit Layout Level” Metadata:
- Title: ➤ Electromigration Modeling at Circuit Layout Level
- Author: Cher Ming Tan
- Language: English
- Number of Pages: Median: 110
- Publisher: ➤ Imprint: Springer - Springer - Springer Singapore
- Publish Date: 2013
- Publish Location: Singapore
“Electromigration Modeling at Circuit Layout Level” Subjects and Themes:
- Subjects: ➤ Engineering - Quality Control, Reliability, Safety and Risk - Electronic Circuits and Devices - System safety - Atomic, Molecular, Optical and Plasma Physics - Integrated circuits - Diffusion
Edition Identifiers:
- The Open Library ID: OL28285878M - OL27034979M
- All ISBNs: 9814451223 - 9789814451215 - 9789814451222 - 9814451215
Access and General Info:
- First Year Published: 2013
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: Unclassified
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2Electromigration Modeling at Circuit Layout Level
By Cher Ming Tan
“Electromigration Modeling at Circuit Layout Level” Metadata:
- Title: ➤ Electromigration Modeling at Circuit Layout Level
- Author: Cher Ming Tan
- Publisher: Springer Verlag, Singapore
- Publish Date: 2013
“Electromigration Modeling at Circuit Layout Level” Subjects and Themes:
- Subjects: Integrated circuits - Diffusion
Edition Identifiers:
- The Open Library ID: OL26129477M
- All ISBNs: 9814451207 - 9789814451208
Access and General Info:
- First Year Published: 2013
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
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- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
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