Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density - Info and Reading Options
By Russell, T. J.
"Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density" was published by U.S. Dept. of Commerce, National Bureau of Standards in 1982 - Washington, DC, it has 36 pages and the language of the book is English.
“Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density” Metadata:
- Title: ➤ Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
- Author: Russell, T. J.
- Language: English
- Number of Pages: 36
- Publisher: ➤ U.S. Dept. of Commerce, National Bureau of Standards
- Publish Date: 1982
- Publish Location: Washington, DC
“Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density” Subjects and Themes:
- Subjects: ➤ Electric charge and distribution - Microelectronics - Oxides - Thermal properties
Edition Specifications:
- Pagination: iv, 36 p. :
Edition Identifiers:
- The Open Library ID: OL17955414M - OL6552068W
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