Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density - Info and Reading Options

By Russell, T. J. ( 1943 - )

“Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density” Metadata:

Title: ➤ Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
Author: Russell, T. J.

“Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density” Subjects and Themes:

Subjects: ➤ Electric charge and distribution - Microelectronics - Oxides - Thermal properties

Edition Identifiers:

The Open Library ID: OL6552068W

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