"Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies" - Information and Links:

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"Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies" was published by Electrochemical Society in 1989 - Pennington, NJ (10 S. Main St., Pennington 08534-2896), it has 495 pages and the language of the book is English.


“Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies” Metadata:

  • Title: ➤  Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies
  • Language: English
  • Number of Pages: 495
  • Publisher: Electrochemical Society
  • Publish Date:
  • Publish Location: ➤  Pennington, NJ (10 S. Main St., Pennington 08534-2896)

“Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies” Subjects and Themes:

Edition Specifications:

  • Pagination: viii, 495 p. :

Edition Identifiers:

  • The Open Library ID: OL2230175M - OL23061430W
  • Online Computer Library Center (OCLC) ID: 20357147
  • Library of Congress Control Number (LCCN): 89083803

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