Simulation and Test Generation Environments, IEEE Workshop - Info and Reading Options
Proceedings/86Ch2296-2
By IEEE Workshop on Simulation & Test Generation Environments (1985 San Francisco, Calif.)
"Simulation and Test Generation Environments, IEEE Workshop" was published by Ieee in December 1986 - Washington, D.C. : Los Angeles, CA, it has 179 pages and the language of the book is English.
“Simulation and Test Generation Environments, IEEE Workshop” Metadata:
- Title: ➤ Simulation and Test Generation Environments, IEEE Workshop
- Author: ➤ IEEE Workshop on Simulation & Test Generation Environments (1985 San Francisco, Calif.)
- Language: English
- Number of Pages: 179
- Publisher: Ieee
- Publish Date: December 1986
- Publish Location: ➤ Washington, D.C. : Los Angeles, CA
“Simulation and Test Generation Environments, IEEE Workshop” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Congresses - Integrated circuits - Testing - Image processing - Conference papers and proceedings
Edition Specifications:
- Format: Hardcover
Edition Identifiers:
- The Open Library ID: OL11390704M - OL5285349W
- Library of Congress Control Number (LCCN): 86080457
- ISBN-13: 9780818687327 - 9780818607325 - 9780818647321
- ISBN-10: 0818687320
- All ISBNs: 0818687320 - 9780818687327 - 9780818607325 - 9780818647321
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