Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics) - Info and Reading Options
By Peter Pichler
"Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)" is published by Springer in July 20, 2004, it has 554 pages and the language of the book is English.
“Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)” Metadata:
- Title: ➤ Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
- Author: Peter Pichler
- Language: English
- Number of Pages: 554
- Publisher: Springer
- Publish Date: July 20, 2004
“Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)” Subjects and Themes:
- Subjects: Silicon crystals - Defects - Semiconductors - Diffusion - Optoelectronics
Edition Specifications:
- Format: Hardcover
- Weight: 2.6 pounds
- Dimensions: 9.6 x 6.6 x 1 inches
Edition Identifiers:
- The Open Library ID: OL9758583M - OL9266679W
- Online Computer Library Center (OCLC) ID: 55963103
- Library of Congress Control Number (LCCN): 2004559515
- ISBN-13: 9783211206874
- ISBN-10: 3211206876
- All ISBNs: 3211206876 - 9783211206874
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