Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics) - Info and Reading Options
By Peter Pichler
"Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)" is published by Springer in July 20, 2004 - Wien ; New York, it has 554 pages and the language of the book is English.
“Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)” Metadata:
- Title: ➤ Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
- Author: Peter Pichler
- Language: English
- Number of Pages: 554
- Publisher: Springer
- Publish Date: July 20, 2004
- Publish Location: Wien ; New York
“Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)” Subjects and Themes:
- Subjects: ➤ Silicon crystals - Defects - Semiconductors - Diffusion - Optoelectronics - Impurity distribution
Edition Specifications:
- Format: Hardcover
- Weight: 2.6 pounds
- Dimensions: 9.6 x 6.6 x 1 inches
Edition Identifiers:
- The Open Library ID: OL9758583M - OL9266679W
- Online Computer Library Center (OCLC) ID: 55963103
- Library of Congress Control Number (LCCN): 2004559515
- ISBN-13: 9783211206874
- ISBN-10: 3211206876
- All ISBNs: 3211206876 - 9783211206874
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