Test Conference - Info and Reading Options
By International Test Conference (18th 1987 Washington, D.C.)
"Test Conference" was published by IEEE Computer Society Press,U.S. in September 1987 - Washington, D.C, it has 1050 pages and the language of the book is English.
“Test Conference” Metadata:
- Title: Test Conference
- Author: ➤ International Test Conference (18th 1987 Washington, D.C.)
- Language: English
- Number of Pages: 1050
- Publisher: ➤ IEEE Computer Society Press,U.S.
- Publish Date: September 1987
- Publish Location: Washington, D.C
“Test Conference” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Circuits - Congresses - Electronic digital computers - Integrated circuits - Semiconductors - Testing
Edition Specifications:
- Format: Hardcover
Edition Identifiers:
- The Open Library ID: OL11389135M - OL4993662W
- Library of Congress Control Number (LCCN): 87080439
- ISBN-13: 9780818607981 - 9780818647987 - 9780818687983
- ISBN-10: 081860798X
- All ISBNs: 081860798X - 9780818607981 - 9780818647987 - 9780818687983
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