Influence of Temperature on Microelectronics and System Reliability
A Physics of Failure Approach
By Pradeep Lall
"Influence of Temperature on Microelectronics and System Reliability" is published by Taylor & Francis Group in 2020, it has 336 pages and the language of the book is English.
“Influence of Temperature on Microelectronics and System Reliability” Metadata:
- Title: ➤ Influence of Temperature on Microelectronics and System Reliability
- Author: Pradeep Lall
- Language: English
- Number of Pages: 336
- Publisher: Taylor & Francis Group
- Publish Date: 2020
“Influence of Temperature on Microelectronics and System Reliability” Subjects and Themes:
- Subjects: ➤ Reliability - Electronic apparatus and appliances - Materials - Microelectronics - Thermal properties - Electronic packaging - Microelectronic packaging - Microélectronique - Matériaux - Propriétés thermiques - Mise sous boîtier (Microélectronique) - Appareils électroniques - Fiabilité - TECHNOLOGY - Electricity
Edition Identifiers:
- The Open Library ID: OL30179633M - OL3336720W
- Online Computer Library Center (OCLC) ID: 1176298419
- ISBN-13: 9780429611117
- All ISBNs: 9780429611117
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