Downloads & Free Reading Options - Results
Analog Digital Simulation Of Transient Induced Logic Errors And Upset Susceptibility Of An Advanced Control System by Victor A. Carreño
Read "Analog Digital Simulation Of Transient Induced Logic Errors And Upset Susceptibility Of An Advanced Control System" by Victor A. Carreño through these free online access and download options.
Books Results
Source: The Internet Archive
The internet Archive Search Results
Available books for downloads and borrow from The internet Archive
1NASA Technical Reports Server (NTRS) 19910002966: Analog-digital Simulation Of Transient-induced Logic Errors And Upset Susceptibility Of An Advanced Control System
By NASA Technical Reports Server (NTRS)
A simulation study is described which predicts the susceptibility of an advanced control system to electrical transients resulting in logic errors, latched errors, error propagation, and digital upset. The system is based on a custom-designed microprocessor and it incorporates fault-tolerant techniques. The system under test and the method to perform the transient injection experiment are described. Results for 2100 transient injections are analyzed and classified according to charge level, type of error, and location of injection.
“NASA Technical Reports Server (NTRS) 19910002966: Analog-digital Simulation Of Transient-induced Logic Errors And Upset Susceptibility Of An Advanced Control System” Metadata:
- Title: ➤ NASA Technical Reports Server (NTRS) 19910002966: Analog-digital Simulation Of Transient-induced Logic Errors And Upset Susceptibility Of An Advanced Control System
- Author: ➤ NASA Technical Reports Server (NTRS)
- Language: English
“NASA Technical Reports Server (NTRS) 19910002966: Analog-digital Simulation Of Transient-induced Logic Errors And Upset Susceptibility Of An Advanced Control System” Subjects and Themes:
- Subjects: ➤ NASA Technical Reports Server (NTRS) - ANALOG SIMULATION - DIGITAL SIMULATION - ERROR ANALYSIS - FAULT TOLERANCE - LATCH-UP - LOGIC PROGRAMMING - SINGLE EVENT UPSETS - ERRORS - INJECTION - MICROPROCESSORS - POSITION (LOCATION) - Carreno, Victor A. - Choi, G. - Iyer, R. K.
Edition Identifiers:
- Internet Archive ID: NASA_NTRS_Archive_19910002966
Downloads Information:
The book is available for download in "texts" format, the size of the file-s is: 9.25 Mbs, the file-s for this book were downloaded 57 times, the file-s went public at Sun Sep 25 2016.
Available formats:
Abbyy GZ - Animated GIF - Archive BitTorrent - DjVuTXT - Djvu XML - Item Tile - Metadata - Scandata - Single Page Processed JP2 ZIP - Text PDF -
Related Links:
- Whefi.com: Download
- Whefi.com: Review - Coverage
- Internet Archive: Details
- Internet Archive Link: Downloads
Online Marketplaces
Find NASA Technical Reports Server (NTRS) 19910002966: Analog-digital Simulation Of Transient-induced Logic Errors And Upset Susceptibility Of An Advanced Control System at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
Buy “Analog Digital Simulation Of Transient Induced Logic Errors And Upset Susceptibility Of An Advanced Control System” online:
Shop for “Analog Digital Simulation Of Transient Induced Logic Errors And Upset Susceptibility Of An Advanced Control System” on popular online marketplaces.
- Ebay: New and used books.