Defect Recognition in Semiconductors Before and After Processing - Info and Reading Options
Proceedings of the 4th International Conference, Wilmslow, Uk, 18-22 March 1991
By International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th 1991 Wilmslow, England), England) International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : Wilmslow and M. R. Brozel
"Defect Recognition in Semiconductors Before and After Processing" was published by Institute of Physics Publishing in March 1992, it has 310 pages and the language of the book is English.
“Defect Recognition in Semiconductors Before and After Processing” Metadata:
- Title: ➤ Defect Recognition in Semiconductors Before and After Processing
- Authors: ➤ International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th 1991 Wilmslow, England)England) International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : WilmslowM. R. Brozel
- Language: English
- Number of Pages: 310
- Publisher: ➤ Institute of Physics Publishing
- Publish Date: March 1992
“Defect Recognition in Semiconductors Before and After Processing” Subjects and Themes:
- Subjects: ➤ Congresses - Defects - Gallium arsenide semiconductors - Photoluminescence - Semiconductors - Science/Mathematics - Technology & Industrial Arts - Electronics - Semiconductors - Circuits & components - Electricity, magnetism & electromagnetism - Materials science - Microscopy - Gallium arsenide semiconductor
Edition Specifications:
- Format: Hardcover
- Weight: 2.3 pounds
- Dimensions: 12.2 x 9 x 0.8 inches
Edition Identifiers:
- The Open Library ID: OL7970906M - OL4278854W
- ISBN-13: 9780750301886
- ISBN-10: 0750301880
- All ISBNs: 0750301880 - 9780750301886
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