Defect recognition and image processing in III-V compounds - Info and Reading Options
proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985
By International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 Montpellier, France)
"Defect recognition and image processing in III-V compounds" was published by Elsevier in 1985 - Amsterdam, it has 306 pages and the language of the book is English.
“Defect recognition and image processing in III-V compounds” Metadata:
- Title: ➤ Defect recognition and image processing in III-V compounds
- Author: ➤ International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 Montpellier, France)
- Language: English
- Number of Pages: 306
- Publisher: Elsevier
- Publish Date: 1985
- Publish Location: Amsterdam
“Defect recognition and image processing in III-V compounds” Subjects and Themes:
- Subjects: ➤ Congresses - Defects - Gallium arsenide semiconductors - Image processing - Semiconductors - Gallium arsenide
Edition Specifications:
- Pagination: xii, 306 p. :
Edition Identifiers:
- The Open Library ID: OL2539665M - OL5104159W
- Online Computer Library Center (OCLC) ID: 12669368
- Library of Congress Control Number (LCCN): 85020674
- ISBN-10: 0444425586
- All ISBNs: 0444425586
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