Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems - Info and Reading Options
By Carol F. Vezzetti
"Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems" was published by U.S. Dept. of Commerce, National Institute of Standards and Technology in 1992 - Gaithersburg, MD, it has 37 pages and the language of the book is English.
“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Metadata:
- Title: ➤ Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
- Author: Carol F. Vezzetti
- Language: English
- Number of Pages: 37
- Publisher: ➤ U.S. Dept. of Commerce, National Institute of Standards and Technology
- Publish Date: 1992
- Publish Location: Gaithersburg, MD
“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Subjects and Themes:
- Subjects: ➤ Calibration - Integrated circuits - Microscopes - Microscopy - Optical measurements - Standards - Chromium - Spectra
Edition Specifications:
- Format: Microform
- Pagination: xi, 37 p.
Edition Identifiers:
- The Open Library ID: OL17108962M - OL3862271W
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