Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems - Info and Reading Options

“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Metadata:

• Title: ➤  Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
• Language: English
• Number of Pages: 37
• Publisher: ➤  U.S. Dept. of Commerce, National Institute of Standards and Technology
• Publish Date: 1992
• Publish Location: Gaithersburg, MD

“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Subjects and Themes:

• Subjects: ➤  Integrated circuits -- Calibration -- Standards. - Microscopy -- Calibration -- Standards. - Microscopes -- Calibration -- Standards. - Optical measurements -- Standards.

Edition Specifications:

• Format: Microform
• Pagination: xi, 37 p.

Edition Identifiers:

• The Open Library ID: OL17108962M - OL3862271W

“Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Metadata:

• Title: ➤  Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
• Language: English
• Number of Pages: 37
• Publisher: ➤  U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
• Publish Date: 1992
• Publish Location: Gaithersburg, Md
• Library of Congress Classification: IN PROCESSQC100 .U57 no. 260-117QH211 .U57 no. 260-117

Edition Specifications:

• Pagination: 37 p. ;

Edition Identifiers:

• The Open Library ID: OL1357810M - OL3862271W
• Library of Congress Control Number (LCCN): 92250905

“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Metadata:

• Title: ➤  Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
• Language: English
• Number of Pages: 37
• Publisher: ➤  U.S. Dept. of Commerce, National Institute of Standards and Technology
• Publish Date: 1992
• Publish Location: Gaithersburg, MD

“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Subjects and Themes:

• Subjects: ➤  Integrated circuits -- Calibration -- Standards. - Microscopes -- Calibration -- Standards. - Optical measurements -- Standards.

Edition Specifications:

• Format: Microform
• Pagination: xi, 37 p.

Edition Identifiers:

• The Open Library ID: OL15375343M - OL3862271W

“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Metadata:

• Title: ➤  Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
• Language: English
• Number of Pages: 37
• Publisher: ➤  U.S. Dept. of Commerce, National Institute of Standards and Technology
• Publish Date: 1992
• Publish Location: Gaithersburg, MD

“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Subjects and Themes:

• Subjects: ➤  Integrated circuits -- Calibration -- Standards. - Microscopes -- Calibration -- Standards. - Optical measurements -- Standards.

Edition Specifications:

• Format: Microform
• Pagination: xi, 37 p.

Edition Identifiers:

• The Open Library ID: OL22389274M - OL3862271W

“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Metadata:

• Title: ➤  Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
• Language: English
• Number of Pages: 37
• Publisher: ➤  U.S. Dept. of Commerce, National Institute of Standards and Technology
• Publish Date: 1992
• Publish Location: Gaithersburg, MD

“Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Subjects and Themes:

• Subjects: ➤  Integrated circuits -- Calibration -- Standards. - Microscopes -- Calibration -- Standards. - Optical measurements -- Standards.

Edition Specifications:

• Format: Microform
• Pagination: xi, 37 p.

Edition Identifiers:

• The Open Library ID: OL18059817M - OL3862271W