Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
By Carol F. Vezzetti
"Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems" is published by U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology in 1992 - Gaithersburg, Md, it has 37 pages and the language of the book is English.
“Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Metadata:
- Title: ➤ Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
- Author: Carol F. Vezzetti
- Language: English
- Number of Pages: 37
- Publisher: ➤ U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
- Publish Date: 1992
- Publish Location: Gaithersburg, Md
“Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems” Subjects and Themes:
- Subjects: ➤ Calibration - Integrated circuits - Microscopes - Microscopy - Optical measurements - Standards - Chromium - Spectra
Edition Specifications:
- Pagination: 37 p. ;
Edition Identifiers:
- The Open Library ID: OL1357810M - OL3862271W
- Library of Congress Control Number (LCCN): 92250905
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