Accelerating Test, Validation and Debug of High Speed Serial Interfaces - Info and Reading Options
By Yongquan Fan
"Accelerating Test, Validation and Debug of High Speed Serial Interfaces" was published by Springer London, Limited in 2010 - Dordrecht London and the language of the book is English.
“Accelerating Test, Validation and Debug of High Speed Serial Interfaces” Metadata:
- Title: ➤ Accelerating Test, Validation and Debug of High Speed Serial Interfaces
- Author: Yongquan Fan
- Language: English
- Publisher: Springer London, Limited
- Publish Date: 2010
- Publish Location: Dordrecht London
“Accelerating Test, Validation and Debug of High Speed Serial Interfaces” Subjects and Themes:
- Subjects: ➤ Systems engineering - Engineering - Computer system performance - Electronics - Software engineering - Interface circuits - Testing - Very high speed integrated circuits - Electronic circuits
Edition Specifications:
- Pagination: xii, 194
Edition Identifiers:
- The Open Library ID: OL36194902M - OL17461390W
- ISBN-13: 9789048193981
- All ISBNs: 9789048193981
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