Accelerating Test, Validation and Debug of High Speed Serial Interfaces - Info and Reading Options
By Yongquan Fan
"Accelerating Test, Validation and Debug of High Speed Serial Interfaces" was published by Springer London, Limited in 2010 and the language of the book is English.
“Accelerating Test, Validation and Debug of High Speed Serial Interfaces” Metadata:
- Title: ➤ Accelerating Test, Validation and Debug of High Speed Serial Interfaces
- Author: Yongquan Fan
- Language: English
- Publisher: Springer London, Limited
- Publish Date: 2010
“Accelerating Test, Validation and Debug of High Speed Serial Interfaces” Subjects and Themes:
- Subjects: ➤ Systems engineering - Engineering - Computer system performance - Electronics - Software engineering - Interface circuits - Testing - Very high speed integrated circuits - Electronic circuits
Edition Specifications:
- Pagination: xii, 194
Edition Identifiers:
- The Open Library ID: OL36194902M - OL17461390W
- ISBN-13: 9789048193981
- All ISBNs: 9789048193981
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