Yield and variability optimization of integrated circuits - Info and Reading Options
By J. C. Zhang ( 1963 - )
“Yield and variability optimization of integrated circuits” Metadata:
- Title: ➤ Yield and variability optimization of integrated circuits
- Author: J. C. Zhang
“Yield and variability optimization of integrated circuits” Subjects and Themes:
- Subjects: Integrated circuits - Statistical methods - Reliability - Defects - Design and construction
Edition Identifiers:
- The Open Library ID: OL3523068W
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