Two- and three-dimensional vision systems for inspection, control, and metrology II - Info and Reading Options
26-27 October, 2004, Philadelphia, Pennsylvania, USA
By Kevin Harding
"Two- and three-dimensional vision systems for inspection, control, and metrology II" was published by SPIE in 2004 - Bellingham, Wash, it has 188 pages and the language of the book is English.
“Two- and three-dimensional vision systems for inspection, control, and metrology II” Metadata:
- Title: ➤ Two- and three-dimensional vision systems for inspection, control, and metrology II
- Author: Kevin Harding
- Language: English
- Number of Pages: 188
- Publisher: SPIE
- Publish Date: 2004
- Publish Location: Bellingham, Wash
“Two- and three-dimensional vision systems for inspection, control, and metrology II” Subjects and Themes:
- Subjects: ➤ Computer vision - Imaging systems - Three-dimensional display systems - Quality control - Optical measurements - Measurement - Congresses - Optical methods - Metrology
Edition Specifications:
- Pagination: vii, 188 p. :
Edition Identifiers:
- The Open Library ID: OL3439354M - OL19386359W
- Online Computer Library Center (OCLC) ID: 57543567
- Library of Congress Control Number (LCCN): 2005298675
- ISBN-10: 0819455598
- All ISBNs: 0819455598
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