Trace analysis and technological development - Info and Reading Options
special and contributed papers presented at an international symposium held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981)
"Trace analysis and technological development" was published by Wiley in 1983 - New York, it has 407 pages and the language of the book is English.
“Trace analysis and technological development” Metadata:
- Title: ➤ Trace analysis and technological development
- Language: English
- Number of Pages: 407
- Publisher: Wiley
- Publish Date: 1983
- Publish Location: New York
“Trace analysis and technological development” Subjects and Themes:
- Subjects: Trace analysis - Congresses - Trace elements
Edition Specifications:
- Pagination: x, 407 p. :
Edition Identifiers:
- The Open Library ID: OL3170625M - OL22785509W
- Online Computer Library Center (OCLC) ID: 9756750
- Library of Congress Control Number (LCCN): 83012788
- ISBN-10: 047027462X
- All ISBNs: 047027462X
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