Thermal-Aware Testing of Digital VLSI Circuits and Systems - Info and Reading Options
By Santanu Chattopadhyay
"Thermal-Aware Testing of Digital VLSI Circuits and Systems" was published by Taylor & Francis Group in 2018, it has 118 pages and the language of the book is English.
“Thermal-Aware Testing of Digital VLSI Circuits and Systems” Metadata:
- Title: ➤ Thermal-Aware Testing of Digital VLSI Circuits and Systems
- Author: Santanu Chattopadhyay
- Language: English
- Number of Pages: 118
- Publisher: Taylor & Francis Group
- Publish Date: 2018
“Thermal-Aware Testing of Digital VLSI Circuits and Systems” Subjects and Themes:
- Subjects: ➤ Integrated circuits, very large scale integration - Digital integrated circuits - Temperature measurements - Integrated circuits - Very large scale integration - Testing - Thermal properties - TECHNOLOGY & ENGINEERING - Mechanical
Edition Identifiers:
- The Open Library ID: OL33598321M - OL21344285W
- ISBN-13: 9781351227780
- All ISBNs: 9781351227780
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