The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects - Info and Reading Options
By Lawrence Joseph Sykes
"The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects" was published in 1981 - xx , it has 225 pages and the language of the book is English.
“The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects” Metadata:
- Title: ➤ The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
- Author: Lawrence Joseph Sykes
- Language: English
- Number of Pages: 225
- Publish Date: 1981
- Publish Location: xx
“The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects” Subjects and Themes:
- Subjects: ➤ Electron microscopy - Transmission electron microscopes - Defects - Crystals
Edition Specifications:
- Pagination: vi, 225 leaves :
Edition Identifiers:
- The Open Library ID: OL24137296M - OL16780459W
- Online Computer Library Center (OCLC) ID: 8482591
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