The principles and practice of electron microscopy - Info and Reading Options
By Ian M. Watt
"The principles and practice of electron microscopy" was published by Cambridge University Press in 1997 - Cambridge, it has 484 pages and the language of the book is English.
“The principles and practice of electron microscopy” Metadata:
- Title: ➤ The principles and practice of electron microscopy
- Author: Ian M. Watt
- Language: English
- Number of Pages: 484
- Publisher: Cambridge University Press
- Publish Date: 1997
- Publish Location: Cambridge
“The principles and practice of electron microscopy” Subjects and Themes:
- Subjects: Electron microscopy - Microscopia eletrônica - Electron microscope - Microscopie électronique - Electron microscopes
Edition Specifications:
- Pagination: x, 484 p. :
Edition Identifiers:
- The Open Library ID: OL801210M - OL2957447W
- Online Computer Library Center (OCLC) ID: 32970105
- Library of Congress Control Number (LCCN): 95037567
- ISBN-10: 0521434564 - 0521435919
- All ISBNs: 0521434564 - 0521435919
AI-generated Review of “The principles and practice of electron microscopy”:
Snippets and Summary:
As the unaided human eye moves closer to an object it produces in the brain of the observer a progressively larger and more detailed image until the eye is about 25 cm from the object, at the so-called near point of the eye.
"The principles and practice of electron microscopy" Description:
The Open Library:
As with the first edition, the principal aim of the book is to present the subject of electron microscopy in a readable way, both to readers who may never see an electron microscope but who need to know what these instruments are and how they perform, and also to practising electron microscopists by providing an up-to-date picture of the changes taking place in fields other than their own. Compared with the first edition, the number of chapters has been increased from 5 to 8 (with 4 Appendixes). One of the new chapters explains the interactions taking place between an electron beam and a sample, which results in signals that can be used for imaging and analysis. Another deals with microanalysis in electron microscopes, the invaluable added bonus of using electrons instead of light for microscopy. The third new chapter results from the logical separation of specimen preparation techniques and the interpretation of micrographs into separate chapters. Throughout the book the coverage has been brought completely up to date, whilst retaining techniques devised in the early days of electron microscopy which are still relevant and widely used. This guide to electron microscopy, written by an author with thirty years practical experience of the technique, will be invaluable to new and experienced users of electron microscopes in any area of science and technology.
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