The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements - Info and Reading Options
By James R. Ehrstein
"The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements" was published by U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology in 1997 - Gaithersburg, MD, it has 84 pages and the language of the book is English.
“The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements” Metadata:
- Title: ➤ The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
- Author: James R. Ehrstein
- Language: English
- Number of Pages: 84
- Publisher: ➤ U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
- Publish Date: 1997
- Publish Location: Gaithersburg, MD
“The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements” Subjects and Themes:
- Subjects: Electric properties - Silicon - Materials, testing
Edition Specifications:
- Format: Microform
- Pagination: xv, 84 p.
Edition Identifiers:
- The Open Library ID: OL17817249M - OL5461966W
- Online Computer Library Center (OCLC) ID: 39138544
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