The Capabilities and limitations of auger sputter profiling for studies of semiconductors - Info and Reading Options
"The Capabilities and limitations of auger sputter profiling for studies of semiconductors" was published by U.S. Dept. of Commerce, National Bureau of Standards in 1981 - Washington, D.C, it has 46 pages and the language of the book is English.
“The Capabilities and limitations of auger sputter profiling for studies of semiconductors” Metadata:
- Title: ➤ The Capabilities and limitations of auger sputter profiling for studies of semiconductors
- Language: English
- Number of Pages: 46
- Publisher: ➤ U.S. Dept. of Commerce, National Bureau of Standards
- Publish Date: 1981
- Publish Location: Washington, D.C
“The Capabilities and limitations of auger sputter profiling for studies of semiconductors” Subjects and Themes:
- Subjects: Electron spectroscopy - Semiconductors - Testing - Sputtering (Physics) - Auger electron spectroscopy
Edition Specifications:
- Pagination: vi, 46 p. :
Edition Identifiers:
- The Open Library ID: OL3919155M - OL18302523W
- Library of Congress Control Number (LCCN): 81600003
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