Testing to integrate semiconductor memories into computer mainframes - Info and Reading Options
digest of papers ; Cherry Hill, New Jersey, October 4, 1972
By IEEE Computer Society. Mideastern Area Committee
"Testing to integrate semiconductor memories into computer mainframes" was published by Institute of Electrical and Electronics Engineers in 1973 - New York, it has 96 pages and the language of the book is English.
“Testing to integrate semiconductor memories into computer mainframes” Metadata:
- Title: ➤ Testing to integrate semiconductor memories into computer mainframes
- Author: ➤ IEEE Computer Society. Mideastern Area Committee
- Language: English
- Number of Pages: 96
- Publisher: ➤ Institute of Electrical and Electronics Engineers
- Publish Date: 1973
- Publish Location: New York
“Testing to integrate semiconductor memories into computer mainframes” Subjects and Themes:
- Subjects: Semiconductor storage devices - Testing - Congresses
Edition Specifications:
- Pagination: 96 p.
Edition Identifiers:
- The Open Library ID: OL50454198M - OL37442479W
- Online Computer Library Center (OCLC) ID: 3430598
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