"Testing to integrate semiconductor memories into computer mainframes" - Information and Links:

Testing to integrate semiconductor memories into computer mainframes - Info and Reading Options

digest of papers ; Cherry Hill, New Jersey, October 4, 1972

"Testing to integrate semiconductor memories into computer mainframes" was published by Institute of Electrical and Electronics Engineers in 1973 - New York, it has 96 pages and the language of the book is English.


“Testing to integrate semiconductor memories into computer mainframes” Metadata:

  • Title: ➤  Testing to integrate semiconductor memories into computer mainframes
  • Author: ➤  
  • Language: English
  • Number of Pages: 96
  • Publisher: ➤  Institute of Electrical and Electronics Engineers
  • Publish Date:
  • Publish Location: New York

“Testing to integrate semiconductor memories into computer mainframes” Subjects and Themes:

Edition Specifications:

  • Pagination: 96 p.

Edition Identifiers:

  • The Open Library ID: OL50454198M - OL37442479W
  • Online Computer Library Center (OCLC) ID: 3430598

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