Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits - Info and Reading Options
By Krishnendu Chakrabarty and Sandeep K. Goel
"Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits" was published by CRC Press in 2012.
“Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits” Metadata:
- Title: ➤ Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits
- Authors: Krishnendu ChakrabartySandeep K. Goel
- Publisher: CRC Press
- Publish Date: 2012
“Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits” Subjects and Themes:
- Subjects: ➤ Metal oxide semiconductors, complementary - Nanotechnology - Complementary Metal oxide semiconductors - Testing - MOS complémentaires - Essais - TECHNOLOGY & ENGINEERING - Mechanical
Edition Identifiers:
- The Open Library ID: OL25970630M - OL17390418W
- Online Computer Library Center (OCLC) ID: 859916982
- Library of Congress Control Number (LCCN): 2013028538
- ISBN-13: 9781439829417
- All ISBNs: 9781439829417
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