System-on-Chip Test Architectures (Systems on Silicon) - Info and Reading Options
By Laung-Terng Wang, Charles E. Stroud and Nur A. Touba
"System-on-Chip Test Architectures (Systems on Silicon)" is published by Morgan Kaufmann in November 16, 2007, it has 896 pages and the language of the book is English.
“System-on-Chip Test Architectures (Systems on Silicon)” Metadata:
- Title: ➤ System-on-Chip Test Architectures (Systems on Silicon)
- Authors: Laung-Terng WangCharles E. StroudNur A. Touba
- Language: English
- Number of Pages: 896
- Publisher: Morgan Kaufmann
- Publish Date: November 16, 2007
“System-on-Chip Test Architectures (Systems on Silicon)” Subjects and Themes:
- Subjects: ➤ Very large scale integration - Testing - Design - Integrated circuits - Systems on a chip - Electrical engineering - Technology & Engineering - Computers - General Information - Science/Mathematics - Electricity - Logic Design - Computers & Internet - Technology / Engineering / Electrical - Engineering - Electrical & Electronic - Design - Integrated circuits - Systems on a chip - Testing - Very large scale integration - Integrated circuits, very large scale integration
Edition Specifications:
- Format: Hardcover
- Weight: 3.4 pounds
- Dimensions: 9.3 x 7.5 x 1.8 inches
Edition Identifiers:
- The Open Library ID: OL10072027M - OL16925625W
- Online Computer Library Center (OCLC) ID: 435501530
- Library of Congress Control Number (LCCN): 2007023373
- ISBN-13: 9780123739735
- ISBN-10: 012373973X
- All ISBNs: 012373973X - 9780123739735
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