Surface and Interface Characterization by Electron Optical Methods - Info and Reading Options
By Ugo Valdre
"Surface and Interface Characterization by Electron Optical Methods" was published by Springer in January 1, 1989, it has 319 pages and the language of the book is English.
“Surface and Interface Characterization by Electron Optical Methods” Metadata:
- Title: ➤ Surface and Interface Characterization by Electron Optical Methods
- Author: Ugo Valdre
- Language: English
- Number of Pages: 319
- Publisher: Springer
- Publish Date: January 1, 1989
“Surface and Interface Characterization by Electron Optical Methods” Subjects and Themes:
- Subjects: ➤ Electron microscopy - Surfaces (Physics) - Technique - Congresses - Transmission electron microscopy - Surfaces (physique) - Microscopes électroniques - Microscopie électronique
Edition Specifications:
- Format: Hardcover
Edition Identifiers:
- The Open Library ID: OL10324080M - OL9208154W
- Library of Congress Control Number (LCCN): 88028989
- ISBN-13: 9780306430862
- ISBN-10: 030643086X
- All ISBNs: 030643086X - 9780306430862
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