2000 5th International Workshop on Statistical Metrology
IWSM : June 11, 2000/Hawaii
By International Workshop on Statistical Metrology (5th : 2000 : Hawaii)
"2000 5th International Workshop on Statistical Metrology" is published by Institute of Electrical & Electronics Enginee in February 15, 2001 - Piscataway, the book is classified in Technology & Engineering genre, it has 100 pages and the language of the book is English.
“2000 5th International Workshop on Statistical Metrology” Metadata:
- Title: ➤ 2000 5th International Workshop on Statistical Metrology
- Author: ➤ International Workshop on Statistical Metrology (5th : 2000 : Hawaii)
- Language: English
- Number of Pages: 100
- Is Family Friendly: Yes - No Mature Content
- Publisher: ➤ Institute of Electrical & Electronics Enginee
- Publish Date: February 15, 2001
- Publish Location: Piscataway
- Genres: Technology & Engineering
“2000 5th International Workshop on Statistical Metrology” Subjects and Themes:
- Subjects: Statistical methods - Semiconductors - Characterization - Congresses - Measurement
Edition Specifications:
- Format: Paperback
- Weight: 8 ounces
- Dimensions: 10.5 x 8.2 x 0.2 inches
Edition Identifiers:
- Google Books ID: C9ZvPQAACAAJ
- The Open Library ID: OL10999717M - OL9516450W
- Online Computer Library Center (OCLC) ID: 45011747
- Library of Congress Control Number (LCCN): 99067646
- ISBN-13: 9780780358966
- ISBN-10: 0780358961
- All ISBNs: 0780358961 - 9780780358966
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