Statistical Analysis and Optimization for VLSI - Info and Reading Options
Timing and Power (Series on Integrated Circuits and Systems)
By Ashish Srivastava
"Statistical Analysis and Optimization for VLSI" is published by Springer in June 21, 2005 - Boston, MA, it has 279 pages and the language of the book is English.
“Statistical Analysis and Optimization for VLSI” Metadata:
- Title: ➤ Statistical Analysis and Optimization for VLSI
- Author: Ashish Srivastava
- Language: English
- Number of Pages: 279
- Publisher: Springer
- Publish Date: June 21, 2005
- Publish Location: Boston, MA
“Statistical Analysis and Optimization for VLSI” Subjects and Themes:
- Subjects: ➤ Statistical methods - Very large scale integration - Mathematical optimization - Power supply - Timing circuits - Integrated circuits - Design and construction - Integrated circuits, very large scale integration
Edition Identifiers:
- The Open Library ID: OL7444858M - OL16962814W
- Online Computer Library Center (OCLC) ID: 60558681
- Library of Congress Control Number (LCCN): 2005050148
- ISBN-13: 9780387257389 - 9780387265285
- ISBN-10: 0387257381
- All ISBNs: 0387257381 - 9780387257389 - 9780387265285
AI-generated Review of “Statistical Analysis and Optimization for VLSI”:
Snippets and Summary:
The impact of process and environmental variations on performance has been increasing with each semiconductor technology generation.
"Statistical Analysis and Optimization for VLSI" Description:
Open Data:
Statistical Analysis and Optimization For VLSI: Timing and Power is a state-of-the-art book on the newly emerging field of statistical computer-aided design (CAD) tools. Thevery latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. Included is the necessary mathematical background on techniques which find widespread use in current analysis and optimization. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. The authors also describe recent optimization approaches to timing yield and contrast them to deterministic optimization. The work will enable new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development
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