Spatially resolved characterization of local phenomena in materials and nanostructures
symposium held December 2-6, 2002, Boston, Massachusetts, U.S.A.
By Symposium G, "Spatially Resolved Characterization of Local Phenomena in Materials and Devices" (2002 Boston, Mass.)
"Spatially resolved characterization of local phenomena in materials and nanostructures" is published by Materials Research Society in 2003 - Warrendale, Pa, it has 425 pages and the language of the book is English.
“Spatially resolved characterization of local phenomena in materials and nanostructures” Metadata:
- Title: ➤ Spatially resolved characterization of local phenomena in materials and nanostructures
- Author: ➤ Symposium G, "Spatially Resolved Characterization of Local Phenomena in Materials and Devices" (2002 Boston, Mass.)
- Language: English
- Number of Pages: 425
- Publisher: Materials Research Society
- Publish Date: 2003
- Publish Location: Warrendale, Pa
“Spatially resolved characterization of local phenomena in materials and nanostructures” Subjects and Themes:
- Subjects: ➤ Characterization - Congresses - Nanostructured materials - Scanning probe microscopy - Semiconductors - Technique - Nanotechnology - Nanostructures
Edition Specifications:
- Pagination: xiii, 425 p. :
Edition Identifiers:
- The Open Library ID: OL3704037M - OL6045759W
- Online Computer Library Center (OCLC) ID: 52382812 - 52280425
- Library of Congress Control Number (LCCN): 2003271739
- ISBN-10: 1558996753
- All ISBNs: 1558996753
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