"SOC (System-on-a-Chip) Testing for Plug and Play Test Automation" - Information and Links:

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Info and Reading Options

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The cover of “SOC (System-on-a-Chip) Testing for Plug and Play Test Automation” - Open Library.

"SOC (System-on-a-Chip) Testing for Plug and Play Test Automation" was published by Springer US in 2002 - Boston, MA, it has 200 pages and the language of the book is English.


“SOC (System-on-a-Chip) Testing for Plug and Play Test Automation” Metadata:

  • Title: ➤  SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
  • Author:
  • Language: English
  • Number of Pages: 200
  • Publisher: Springer US
  • Publish Date:
  • Publish Location: Boston, MA

“SOC (System-on-a-Chip) Testing for Plug and Play Test Automation” Subjects and Themes:

Edition Specifications:

  • Format: [electronic resource] /
  • Pagination: ➤  1 online resource (vii, 200 p.)

Edition Identifiers:

AI-generated Review of “SOC (System-on-a-Chip) Testing for Plug and Play Test Automation”:


"SOC (System-on-a-Chip) Testing for Plug and Play Test Automation" Description:

The Open Library:

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Open Data:

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing

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