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Yield And Reliability In Microwave Circuit And System Design by Michael D. Meehan
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Source: The Open Library
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1Yield and reliability in microwave circuit and system design
By Michael D. Meehan and John Purviance
“Yield and reliability in microwave circuit and system design” Metadata:
- Title: ➤ Yield and reliability in microwave circuit and system design
- Authors: Michael D. MeehanJohn Purviance
- Language: English
- Number of Pages: Median: 276
- Publisher: Artech House
- Publish Date: 1993
- Publish Location: Boston
“Yield and reliability in microwave circuit and system design” Subjects and Themes:
- Subjects: Computer-aided design - Design and construction - Engineering design - Microwave integrated circuits - Statistical methods
Edition Identifiers:
- The Open Library ID: OL1723455M
- Online Computer Library Center (OCLC) ID: 26552926
- Library of Congress Control Number (LCCN): 92027018
- All ISBNs: 9780890065273 - 0890065276
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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