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Metrology And Diagnostic Techniques For Nanoelectronics by Zhiyong Ma
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1Metrology and Diagnostic Techniques for Nanoelectronics
By Zhiyong Ma and David G. Seiler
“Metrology and Diagnostic Techniques for Nanoelectronics” Metadata:
- Title: ➤ Metrology and Diagnostic Techniques for Nanoelectronics
- Authors: Zhiyong MaDavid G. Seiler
- Language: English
- Number of Pages: Median: 1454
- Publisher: ➤ Taylor & Francis Group - Jenny Stanford Publishing
- Publish Date: 2016 - 2017
“Metrology and Diagnostic Techniques for Nanoelectronics” Subjects and Themes:
- Subjects: Electronics - Nanoelectronics - Metrology - TECHNOLOGY & ENGINEERING - Mechanical
Edition Identifiers:
- The Open Library ID: OL34635246M - OL53256660M - OL37982616M - OL37972228M
- Online Computer Library Center (OCLC) ID: 980304338
- All ISBNs: ➤ 9781351733953 - 9781315185385 - 9814745081 - 135173394X - 1315185385 - 9789814745086 - 9781351733946 - 1351733958
Access and General Info:
- First Year Published: 2016
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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