Reliability of MEMS
Testing of Materials and Devices
By Gary K. Fedder, Jan G. Korvink and Osamu Tabata
"Reliability of MEMS" is published by Wiley & Sons, Limited, John in 2008, it has 324 pages and the language of the book is English.
“Reliability of MEMS” Metadata:
- Title: Reliability of MEMS
- Authors: Gary K. FedderJan G. KorvinkOsamu Tabata
- Language: English
- Number of Pages: 324
- Publisher: Wiley & Sons, Limited, John
- Publish Date: 2008
“Reliability of MEMS” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL29069862M - OL18579802W
- ISBN-13: 9783527622139
- All ISBNs: 9783527622139
AI-generated Review of “Reliability of MEMS”:
Read “Reliability of MEMS”:
Read “Reliability of MEMS” by choosing from the options below.
Search for “Reliability of MEMS” downloads:
Visit our Downloads Search page to see if downloads are available.
Find “Reliability of MEMS” in Libraries Near You:
Read or borrow “Reliability of MEMS” from your local library.
- The WorldCat Libraries Catalog: Find a copy of “Reliability of MEMS” at a library near you.
Buy “Reliability of MEMS” online:
Shop for “Reliability of MEMS” on popular online marketplaces.