Reliability and hot-electron effects in analog and mixed-mode circuits - Info and Reading Options
By David Ying Ge
“Reliability and hot-electron effects in analog and mixed-mode circuits” Metadata:
- Title: ➤ Reliability and hot-electron effects in analog and mixed-mode circuits
- Author: David Ying Ge
“Reliability and hot-electron effects in analog and mixed-mode circuits” Subjects and Themes:
- Subjects: ➤ Metal oxide semiconductor field-effect transistors - Reliability - Hot carriers - Integrated circuits - Differential amplifiers
Edition Identifiers:
- The Open Library ID: OL11446485W
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