Quantitative X-ray diffractometry - Info and Reading Options
By Lev S. Zevin
"Quantitative X-ray diffractometry" was published by Springer in 1995 - New York, it has 372 pages and the language of the book is English.
“Quantitative X-ray diffractometry” Metadata:
- Title: ➤ Quantitative X-ray diffractometry
- Author: Lev S. Zevin
- Language: English
- Number of Pages: 372
- Publisher: Springer
- Publish Date: 1995
- Publish Location: New York
“Quantitative X-ray diffractometry” Subjects and Themes:
- Subjects: ➤ X-rays - Diffraction - Industrial applications - Rontgenstreuung - Applications industrielles - Rayons X - Raios cosmicos, x e gama - Rontgendiffraktometrie
Edition Specifications:
- Pagination: xvii, 372 p. :
Edition Identifiers:
- The Open Library ID: OL787142M - OL2924613W
- Online Computer Library Center (OCLC) ID: 32547828
- Library of Congress Control Number (LCCN): 95019428
- ISBN-10: 0387945415
- All ISBNs: 0387945415
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