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The cover of “Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications” - Open Library.

"Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications" was published by Electrochemical Society in 1992 - Pennington, NJ, it has 330 pages and the language of the book is English.


“Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications” Metadata:

  • Title: ➤  Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications
  • Author:
  • Language: English
  • Number of Pages: 330
  • Publisher: Electrochemical Society
  • Publish Date:
  • Publish Location: Pennington, NJ
  • Dewey Decimal Classification: 621.3815/2
  • Library of Congress Classification: TK7871.85 .P7487 1992

“Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications” Subjects and Themes:

Edition Specifications:

  • Pagination: viii, 330 p. :

Edition Identifiers:

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