Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing) - Info and Reading Options
By Nicola Nicolici
"Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)" is published by Springer in February 28, 2003, it has 180 pages and the language of the book is English.
“Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” Metadata:
- Title: ➤ Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
- Author: Nicola Nicolici
- Language: English
- Number of Pages: 180
- Publisher: Springer
- Publish Date: February 28, 2003
“Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” Subjects and Themes:
- Subjects: ➤ Very large scale integration Integrated circuits - Semiconductors - Protection - Testing - Thermal properties - Systems engineering - Engineering - Computer-aided design - Integrated circuits, very large scale integration - Integrated circuits - Very large scale integration
Edition Specifications:
- Format: Hardcover
- Weight: 1 pounds
- Dimensions: 9.4 x 6.3 x 0.4 inches
Edition Identifiers:
- The Open Library ID: OL8372478M - OL16926267W
- Online Computer Library Center (OCLC) ID: 51242028
- Library of Congress Control Number (LCCN): 2002043306
- ISBN-13: 9781402072352
- ISBN-10: 140207235X
- All ISBNs: 140207235X - 9781402072352
AI-generated Review of “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)”:
Snippets and Summary:
The topic of this book is power-constrained testing of very large scale integrated (VLSI) circuits.
Read “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)”:
Read “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” by choosing from the options below.
Search for “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” downloads:
Visit our Downloads Search page to see if downloads are available.
Find “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” in Libraries Near You:
Read or borrow “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” from your local library.
- The WorldCat Libraries Catalog: Find a copy of “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” at a library near you.
Buy “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” online:
Shop for “Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)” on popular online marketplaces.
- Ebay: New and used books.