Power-Constrained Testing of VLSI Circuits - Info and Reading Options
By Nicola Nicolici and Bashir M. Al-Hashimi
"Power-Constrained Testing of VLSI Circuits" is published by Springer Science & Business Media in 2003-02-28 - New York, NY, the book is classified in Computers genre, it has 182 pages and the language of the book is English.
“Power-Constrained Testing of VLSI Circuits” Metadata:
- Title: ➤ Power-Constrained Testing of VLSI Circuits
- Authors: Nicola NicoliciBashir M. Al-Hashimi
- Language: English
- Number of Pages: 182
- Is Family Friendly: Yes - No Mature Content
- Publisher: ➤ Springer Science & Business Media
- Publish Date: 2003-02-28
- Publish Location: New York, NY
- Genres: Computers
Edition Identifiers:
- Google Books ID: AD-dk8xXqkgC
- ISBN-13: 9781402072352 - 9780306487316
- ISBN-10: 140207235X
- All ISBNs: 9781402072352 - 140207235X - 9780306487316
AI-generated Review of “Power-Constrained Testing of VLSI Circuits”:
Snippets and Summary:
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow.
"Power-Constrained Testing of VLSI Circuits" Description:
Google Books:
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
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- Public Domain: No
- Availability Status: Partially available
- Availability Status for country: US.
- Available Formats: Text is not avialbe, image copy is available.
- Google Books Link: Google Books
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