Polarization analysis and applications to device technology - Info and Reading Options
International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan
By International Symposium on Polarization Analysis and Applications to Device Technology (1996 Yokahama, Japan)
"Polarization analysis and applications to device technology" was published by SPIE in 1996 - Bellingham, Wash., USA, it has 350 pages and the language of the book is English.
“Polarization analysis and applications to device technology” Metadata:
- Title: ➤ Polarization analysis and applications to device technology
- Author: ➤ International Symposium on Polarization Analysis and Applications to Device Technology (1996 Yokahama, Japan)
- Language: English
- Number of Pages: 350
- Publisher: SPIE
- Publish Date: 1996
- Publish Location: Bellingham, Wash., USA
“Polarization analysis and applications to device technology” Subjects and Themes:
- Subjects: ➤ Congresses - Double Refraction - Electrooptical devices - Electrooptics - Optoelectronic devices - Polarimetry - Polarizers (Light) - Refraction, Double - Optics - Polarization (light) - Optical instruments
Edition Specifications:
- Pagination: xiii, 350 p. :
Edition Identifiers:
- The Open Library ID: OL1016493M - OL3365458W
- Online Computer Library Center (OCLC) ID: 35454665
- Library of Congress Control Number (LCCN): 96069904
- ISBN-10: 0819422711
- All ISBNs: 0819422711
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