International Symposium on Polarization Analysis and Applications to Device Technology - Info and Reading Options
12-14 June 1996, Yokohama, Japan
By International Symposium on Polarization Analysis and Applications to Device Technology (1996 Yokahama, Japan)
"International Symposium on Polarization Analysis and Applications to Device Technology" was published by SPIE in 1996 - Bellingham, Wash., USA, the book is classified in Electrooptical devices genre, it has 350 pages and the language of the book is English.
“International Symposium on Polarization Analysis and Applications to Device Technology” Metadata:
- Title: ➤ International Symposium on Polarization Analysis and Applications to Device Technology
- Author: ➤ International Symposium on Polarization Analysis and Applications to Device Technology (1996 Yokahama, Japan)
- Language: English
- Number of Pages: 350
- Is Family Friendly: Yes - No Mature Content
- Publisher: SPIE
- Publish Date: 1996
- Publish Location: Bellingham, Wash., USA
- Genres: Electrooptical devices
“International Symposium on Polarization Analysis and Applications to Device Technology” Subjects and Themes:
- Subjects: ➤ Congresses - Double Refraction - Electrooptical devices - Electrooptics - Optoelectronic devices - Polarimetry - Polarizers (Light) - Refraction, Double - Optics - Polarization (light) - Optical instruments
Edition Specifications:
- Pagination: xiii, 350 p. :
Edition Identifiers:
- Google Books ID: uiOQPgAACAAJ
- The Open Library ID: OL1016493M - OL3365458W
- Online Computer Library Center (OCLC) ID: 35454665
- Library of Congress Control Number (LCCN): 96069904
- ISBN-13: 9780819422712
- ISBN-10: 0819422711
- All ISBNs: 0819422711 - 9780819422712
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