"NASA Technical Reports Server (NTRS) 19970015462: A Statistical Simulation Approach To Safe Life Fatigue Analysis Of Redundant Metallic Components" - Information and Links:

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"NASA Technical Reports Server (NTRS) 19970015462: A Statistical Simulation Approach To Safe Life Fatigue Analysis Of Redundant Metallic Components" and the language of the book is English.


“NASA Technical Reports Server (NTRS) 19970015462: A Statistical Simulation Approach To Safe Life Fatigue Analysis Of Redundant Metallic Components” Metadata:

  • Title: ➤  NASA Technical Reports Server (NTRS) 19970015462: A Statistical Simulation Approach To Safe Life Fatigue Analysis Of Redundant Metallic Components
  • Author: ➤  
  • Language: English

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  • Internet Archive ID: NASA_NTRS_Archive_19970015462

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"NASA Technical Reports Server (NTRS) 19970015462: A Statistical Simulation Approach To Safe Life Fatigue Analysis Of Redundant Metallic Components" Description:

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This paper introduces a dual active load path fail-safe fatigue design concept analyzed by Monte Carlo simulation. The concept utilizes the inherent fatigue life differences between selected pairs of components for an active dual path system, enhanced by a stress level bias in one component. The design is applied to a baseline design; a safe life fatigue problem studied in an American Helicopter Society (AHS) round robin. The dual active path design is compared with a two-element standby fail-safe system and the baseline design for life at specified reliability levels and weight. The sensitivity of life estimates for both the baseline and fail-safe designs was examined by considering normal and Weibull distribution laws and coefficient of variation levels. Results showed that the biased dual path system lifetimes, for both the first element failure and residual life, were much greater than for standby systems. The sensitivity of the residual life-weight relationship was not excessive at reliability levels up to R = 0.9999 and the weight penalty was small. The sensitivity of life estimates increases dramatically at higher reliability levels.

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