Microelectronic test pattern NBS-4 - Info and Reading Options
By W. Robert Thurber
"Microelectronic test pattern NBS-4" was published by U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off. in 1978 - Washington, it has 83 pages and the language of the book is English.
“Microelectronic test pattern NBS-4” Metadata:
- Title: ➤ Microelectronic test pattern NBS-4
- Author: W. Robert Thurber
- Language: English
- Number of Pages: 83
- Publisher: ➤ U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
- Publish Date: 1978
- Publish Location: Washington
“Microelectronic test pattern NBS-4” Subjects and Themes:
- Subjects: ➤ Equipment and supplies - Microelectronics - Semiconductors - Silicones - Testing - Silicon
Edition Specifications:
- Pagination: vi, 83 p. :
Edition Identifiers:
- The Open Library ID: OL4376164M - OL6536315W
- Library of Congress Control Number (LCCN): 78606024
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