Metrology and Physical Mechanisms in New Generation Ionic Devices - Info and Reading Options
By Umberto Celano
"Metrology and Physical Mechanisms in New Generation Ionic Devices" is published by Springer in Jun 07, 2018, the book is classified in Science genre, it has 199 pages and the language of the book is English.
“Metrology and Physical Mechanisms in New Generation Ionic Devices” Metadata:
- Title: ➤ Metrology and Physical Mechanisms in New Generation Ionic Devices
- Author: Umberto Celano
- Language: English
- Number of Pages: 199
- Is Family Friendly: Yes - No Mature Content
- Publisher: Springer
- Publish Date: Jun 07, 2018
- Genres: Science
“Metrology and Physical Mechanisms in New Generation Ionic Devices” Subjects and Themes:
- Subjects: ➤ Thin films - Electronic apparatus and appliances - Metrology
Edition Specifications:
- Format: paperback
Edition Identifiers:
- Google Books ID: PZk6uAEACAAJ
- The Open Library ID: OL30793278M - OL20672787W
- ISBN-13: 9783319819068
- ISBN-10: 3319819062
- All ISBNs: 3319819062 - 9783319819068
AI-generated Review of “Metrology and Physical Mechanisms in New Generation Ionic Devices”:
Snippets and Summary:
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM.
"Metrology and Physical Mechanisms in New Generation Ionic Devices" Description:
Google Books:
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
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